{
  "$type": "site.standard.document",
  "description": "The method involves emitting measurement radiation, when an optical measurement axis of the measurement radiation is aligned with the point (10) to be measured. The optical measurement point region is defined by the beam cross section of the radiation on the object. The measurement radiation…",
  "path": "/patents/971586",
  "publishedAt": "2014-08-06T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/026",
    "HEXAGON TECHNOLOGY CT GMBH [CH]"
  ],
  "textContent": "The method involves emitting measurement radiation, when an optical measurement axis of the measurement radiation is aligned with the point (10) to be measured. The optical measurement point region is defined by the beam cross section of the radiation on the object. The measurement radiation reflected from the object is received. The distance to the point on the object is determined from the received measurement radiation. The emission direction of the measurement radiation is altered with respective emission and reception of the measurement radiation. Independent claims are included for the following: (1) a measuring apparatus for determining distance to point to be measured on object; and (2) a computer program product for determining distance to point to be measured on object.",
  "title": "Optical single-point measurement"
}