{
  "$type": "site.standard.document",
  "description": "An ECU executes a program including the steps of: obtaining (S100) a first temperature Ta of a first semiconductor element; obtaining (S102) a second temperature Tb of a third semiconductor element; determining (S110) that it is in a normal state in which clogging has not occurred, when a rotating…",
  "path": "/patents/971682",
  "publishedAt": "2014-08-06T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B60K1/00",
    "TOYOTA MOTOR CO LTD [JP]"
  ],
  "textContent": "An ECU executes a program including the steps of: obtaining (S100) a first temperature Ta of a first semiconductor element; obtaining (S102) a second temperature Tb of a third semiconductor element; determining (S110) that it is in a normal state in which clogging has not occurred, when a rotating speed Nm2 of a second MG is more than a threshold value Nm2(0) (YES in S104) and the magnitude of a difference between the first temperature Ta and the second temperature Tb is less than a threshold value T (YES in S106); and determining (S112) that the clogging of a foreign matter has occurred in a predetermined site when the magnitude of the difference between the first temperature Ta and the second temperature Tb is equal to or more than the threshold value T (NO in S106).",
  "title": "COOLING DEVICE PROBLEM DETECTION DEVICE AND PROBLEM DETECTION METHOD"
}