{
  "$type": "site.standard.document",
  "description": "Embodiments of the present invention relate to a method and a device for measuring a current. The method includes: measuring a temperature between a first sampling point and a second sampling point on a copper bar carrying a current to be measured, and outputting a first signal according to the…",
  "path": "/patents/972893",
  "publishedAt": "2014-07-09T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01K13/00",
    "HUAWEI TECH CO LTD [CN]"
  ],
  "textContent": "Embodiments of the present invention relate to a method and a device for measuring a current. The method includes: measuring a temperature between a first sampling point and a second sampling point on a copper bar carrying a current to be measured, and outputting a first signal according to the measured temperature; outputting a second signal after sampling and filtering the first signal; detecting the first voltage signal at the first sampling point and the second voltage signal at the second sampling point, sampling and filtering a difference between the first voltage signal and the second voltage signal, and outputting a third voltage signal; restoring the second signal to a temperature value representing a temperature between the first sampling point and the second sampling point, calculating a resistance value between the first sampling point and the second sampling point according to the temperature value; restoring the third voltage signal to a voltage value representing a voltage between the first sampling point and the second sampling point; and calculating the value of a current between the first sampling point and the second sampling point according to the voltage value and the resistance value.",
  "title": "METHOD AND DEVICE FOR MEASURING CURRENT"
}