{
  "$type": "site.standard.document",
  "coverImage": {
    "$type": "blob",
    "ref": {
      "$link": "bafkreihceqvkoty4efy5t5nrppofxzi7dovjdp4c4eaazgx6jkdk3geihi"
    },
    "mimeType": "image/png",
    "size": 119575
  },
  "description": "A structure is a structure of a quartz crystal substrate having a slit. The structure includes, as an inner wall of the slit, a first side surface, a second side surface, a first end surface, and a second end surface. The first side surface extends along a first direction which is a longitudinal…",
  "path": "/patents/1360161",
  "publishedAt": "2024-02-29T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H03H9/215",
    "SEIKO EPSON CORPORATION"
  ],
  "textContent": "A structure is a structure of a quartz crystal substrate having a slit. The structure includes, as an inner wall of the slit, a first side surface, a second side surface, a first end surface, and a second end surface. The first side surface extends along a first direction which is a longitudinal direction of the slit, and the second side surface extends along the first direction. The first end surface is continuous with the first side surface and extends along a first crystal plane of the quartz crystal substrate, and the second end surface is continuous with the second side surface and extends along a second crystal plane of the quartz crystal substrate. In a plan view of the quartz crystal substrate, an intersection point where a first straight line corresponding to the first end surface and a second straight line corresponding to the second end surface intersect each other is located inside the quartz crystal substrate.",
  "title": "STRUCTURE, PHYSICAL QUANTITY SENSOR, INERTIAL SENSOR, AND METHOD FOR MANUFACTURING STRUCTURE"
}