{
  "$type": "site.standard.document",
  "description": "A secondary battery control system that conducts abnormality detection while predicting other parameters (internal resistance, SOC, and the like) with high accuracy is provided. A difference between an observation value (voltage) at a certain point in time and a voltage that is estimated using a…",
  "path": "/patents/1362055",
  "publishedAt": "2024-04-11T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/3842",
    "SEMICONDUCTOR ENERGY LABORATORY CO., LTD."
  ],
  "textContent": "A secondary battery control system that conducts abnormality detection while predicting other parameters (internal resistance, SOC, and the like) with high accuracy is provided. A difference between an observation value (voltage) at a certain point in time and a voltage that is estimated using a prior-state variable is sensed. A threshold voltage is set in advance, and from the voltage difference that is sensed, a sudden abnormality, specifically a micro-short circuit or the like is detected. Furthermore, it is preferable that detection be performed by using a neural network to learn data on voltage difference in a time series and determine abnormality or normality.",
  "title": "DEVICE DETECTING ABNORMALITY OF SECONDARY BATTERY, ABNORMALITY DETECTION METHOD, AND PROGRAM"
}