{
  "$type": "site.standard.document",
  "description": "An apparatus includes a first sampling switch coupled between a first voltage bus and a sampling capacitor, a first clock generator configured to produce a first gate drive signal fed into a gate of the first sampling switch, the first clock generator comprising a first capacitive coupled clock…",
  "path": "/patents/1363677",
  "publishedAt": "2024-05-16T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/396",
    "NuVolta Technologies (Hefei) Co., Ltd."
  ],
  "textContent": "An apparatus includes a first sampling switch coupled between a first voltage bus and a sampling capacitor, a first clock generator configured to produce a first gate drive signal fed into a gate of the first sampling switch, the first clock generator comprising a first capacitive coupled clock shifter, a first reset circuit and a second reset circuit, a second sampling switch coupled between a second voltage bus and the sampling capacitor, and a second clock generator configured to produce a second gate drive signal fed into a gate of the second sampling switch, the second clock generator comprising a second capacitive coupled clock shifter, a third reset circuit and a fourth reset circuit.",
  "title": "Voltage Sampling Apparatus and Method"
}