{
  "$type": "site.standard.document",
  "description": "An electronic control system includes first through third measurement units that measure current, temperature and current or temperature, respectively. An electronic control device controls an operation of a power semiconductor element by using measurement results of the first through third…",
  "path": "/patents/1364012",
  "publishedAt": "2024-05-23T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H02H5/041",
    "Hitachi Astemo, Ltd."
  ],
  "textContent": "An electronic control system includes first through third measurement units that measure current, temperature and current or temperature, respectively. An electronic control device controls an operation of a power semiconductor element by using measurement results of the first through third measurement units. At least a part of the power semiconductor element incorporates the first and second measurement units, and the electronic control device estimates temperature from a measured value of the current. Whether the first measurement unit, the second measurement unit, and the third measurement unit are normal or abnormal on a basis of a measured value of the first measurement unit is determined, and an abnormality is determined of at least one of the power semiconductor element and a wire harness through which an output current of the power semiconductor element flows according to a measurement result of the measurement unit determined to be normal.",
  "title": "ELECTRONIC CONTROL SYSTEM AND ELECTRONIC CONTROL DEVICE"
}