{
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  "description": "A cathode active material for a lithium secondary battery has a structure of a lithium-nickel-based metal oxide. A crystal size in a (104) plane defined by Equation 1 is less than 200 nm. A thickness of a TM slab measured by a Rietveld method in a crystal structure of a space group R-3m by an X-ray…",
  "path": "/patents/1364852",
  "publishedAt": "2024-06-13T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "C01G53/50",
    "SK ON CO., LTD."
  ],
  "textContent": "A cathode active material for a lithium secondary battery has a structure of a lithium-nickel-based metal oxide. A crystal size in a (104) plane defined by Equation 1 is less than 200 nm. A thickness of a TM slab measured by a Rietveld method in a crystal structure of a space group R-3m by an X-ray diffraction (XRD) analysis is 2.15 Å or less. A thickness of a Li slab thickness measured by the Rietveld method in the crystal structure of the space group R-3m by the XRD analysis is 2.585 Å or more.",
  "title": "CATHODE ACTIVE MATERIAL FOR LITHIUM SECONDARY BATTERY AND LITHIUM SECONDARY BATTERY INCLUDING THE SAME"
}