{
  "$type": "site.standard.document",
  "description": "The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more…",
  "path": "/patents/984461",
  "publishedAt": "2013-08-28T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01J1/16",
    "OLYMPUS CORP [JP]"
  ],
  "textContent": "The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the position of the light detection region in a sample solution by changing the optical path of the optical system of the microscope; detecting individually signals of the light from each light-emitting particle in the intensities of the components of the two or more wavelength bands of the detected light; and identifying a kind of light-emitting particle based on the intensities of the components of the two or more wavelength bands of the signals of the light of the detected light-emitting particle.",
  "title": "PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE"
}