{
  "$type": "site.standard.document",
  "coverImage": {
    "$type": "blob",
    "ref": {
      "$link": "bafkreickuvvrg7oipoys2wdt52clquj443eflmqfqb6yuarjofzmm53gke"
    },
    "mimeType": "image/png",
    "size": 109343
  },
  "description": "The instrument (1) has a base (10) defining a vertical axis (11). A beam deflector (30) is rotated about a horizontal axis (31) relative to a body (20). A visual field is defined by an imaging system and the deflector and aligned with a measurement axis of the deflector. Distance between a target…",
  "path": "/patents/988033",
  "publishedAt": "2013-07-31T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/14",
    "HEXAGON TECHNOLOGY CT GMBH [CH]"
  ],
  "textContent": "The instrument (1) has a base (10) defining a vertical axis (11). A beam deflector (30) is rotated about a horizontal axis (31) relative to a body (20). A visual field is defined by an imaging system and the deflector and aligned with a measurement axis of the deflector. Distance between a target point and alignment of the measurement axis and a position of the target point are determined in dependence on the distance and orientation of the measurement axis during controlling triggering of single point measurement by a controlling and processing unit. An independent claim is also included for a method for measuring a position determination of a point with a surveying instrument.",
  "title": "Surveying device with scan functionality and single-point measuring mode"
}