{
  "$type": "site.standard.document",
  "description": "A deformation analysis device and a non-destructive analysis method for a secondary battery are capable of accurately diagnosing electrode deformation of the secondary battery using a computed tomography (CT) image. The deformation analysis method for the secondary battery includes performing…",
  "path": "/patents/1371210",
  "publishedAt": "2024-11-21T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G06T7/0006",
    "SAMSUNG SDI CO., LTD"
  ],
  "textContent": "A deformation analysis device and a non-destructive analysis method for a secondary battery are capable of accurately diagnosing electrode deformation of the secondary battery using a computed tomography (CT) image. The deformation analysis method for the secondary battery includes performing computed tomography (CT) scanning on each of a first area and a second area of the secondary battery to acquire a first image corresponding to the first area and a second image corresponding to the second area, measuring a first angle from a winding front end to a winding distal end of an electrode of an electrode assembly in the first image and measuring a second angle from the winding front end to the winding distal end of the electrode of the electrode assembly in the second image, and determining that the electrode assembly is deformed if a difference value between the first angle and the second angle is greater than a reference value.",
  "title": "DEFORMATION ANALYSIS DEVICE AND METHOD FOR SECONDARY BATTERY"
}