{
  "$type": "site.standard.document",
  "description": "The present disclosure is directed to accelerometer measurement compensation for a device with first and second accelerometers. The first and second accelerometers are included in first and second components, respectively, of the device that are configured to rotate with respect to a hinge. The…",
  "path": "/patents/1371541",
  "publishedAt": "2024-12-05T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C25/005",
    "STMicroelectronics International N.V."
  ],
  "textContent": "The present disclosure is directed to accelerometer measurement compensation for a device with first and second accelerometers. The first and second accelerometers are included in first and second components, respectively, of the device that are configured to rotate with respect to a hinge. The device detects a stuck condition of the first accelerometer, and compensates acceleration measurements of the first accelerometer by exploiting redundant information from the second accelerometer and applying a runtime calibration of undesired offsets.",
  "title": "ACCELEROMETER STUCK CONDITION COMPENSATION FOR DEVICES WITH MULTIPLE ACCELEROMETERS"
}