{
  "$type": "site.standard.document",
  "description": "A deformation analysis device for a secondary battery and a non-destructive analysis method by which electrode deformation of a secondary battery may be diagnosed using a computed tomography (CT) image, the method including the steps of obtaining an image by performing computed tomography (CT) on…",
  "path": "/patents/1374457",
  "publishedAt": "2026-06-02T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01N23/046",
    "SAMSUNG SDI CO., LTD."
  ],
  "textContent": "A deformation analysis device for a secondary battery and a non-destructive analysis method by which electrode deformation of a secondary battery may be diagnosed using a computed tomography (CT) image, the method including the steps of obtaining an image by performing computed tomography (CT) on the secondary battery, generating an intensity graph using brightness differences from the image, measuring a core peak FWHM (full width at half maximum) or a core diameter change value from the intensity graph, and determining that the electrode assembly is deformed if the measured core peak FWHM is greater than a peak reference value or the core diameter change value is greater than a diameter reference value.",
  "title": "Deformation analysis device for secondary battery and method thereof"
}