{
  "$type": "site.standard.document",
  "description": "In an optical displacement sensor (10) having a predetermined optical system, the predetermined optical system is adjusted to meet the Scheimpflug condition. The predetermined optical system has a projection module (9) configured to project light onto an object to be measured (16); a…",
  "path": "/patents/994692",
  "publishedAt": "2012-12-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/026",
    "OMRON TATEISI ELECTRONICS CO [JP]"
  ],
  "textContent": "In an optical displacement sensor (10) having a predetermined optical system, the predetermined optical system is adjusted to meet the Scheimpflug condition. The predetermined optical system has a projection module (9) configured to project light onto an object to be measured (16); a light-receiving element (13) configured to receive reflected light reflected by the object to be measured (16) of light projected from the projection module (9); and a light-receiving lens (14) configured to image the reflected light onto the light-receiving element (13), the light-receiving lens being positioned between the object to be measured (16) and the light-receiving element (13). The adjustment method performs an adjustment by moving only the light-receiving lens (14) in a direction of an optical axis (Z 1 direction) of the light-receiving lens (14) and in a direction perpendicular (X 1 direction) to the direction of the optical axis of the light-receiving lens (14).",
  "title": "METHOD FOR ADJUSTING OPTICAL DISPLACEMENT SENSOR AND METHOD FOR MANUFACTURING OPTICAL DISPLACEMENT SENSOR"
}