{
  "$type": "site.standard.document",
  "description": "A battery management module, including a microcontroller unit, a first comparator configured to compare an input signal with a first reference signal and output a first comparison result and a NAND gate circuit configured to receive a first input from the microcontroller unit and a second input…",
  "path": "/patents/1375401",
  "publishedAt": "2025-05-08T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/31703",
    "Samsung SDI Co., Ltd."
  ],
  "textContent": "A battery management module, including a microcontroller unit, a first comparator configured to compare an input signal with a first reference signal and output a first comparison result and a NAND gate circuit configured to receive a first input from the microcontroller unit and a second input that is the first comparison result from the first comparator to generate an output signal, wherein, in an inspection mode, the first comparator is connected to a battery module tester, the microcontroller unit outputs a low-level signal as the first input, the first comparator receives the input signal from the battery module tester and outputs a low-level signal as the first comparison result and the microcontroller unit is further configured to receive the output signal of the NAND gate circuit and determine the NAND gate circuit is defective in response to the output signal of the NAND gate circuit being a low-level signal.",
  "title": "BATTERY MANAGEMENT MODULE AND METHOD FOR DETECTING DEFECTIVE NAND GATE CIRCUIT IN BATTERY MANAGEMENT MODULE"
}