{
  "$type": "site.standard.document",
  "description": "Proposed are a leak inspection apparatus for secondary battery cells and a leak inspection method for secondary battery cells and, more particularly, a leak inspection apparatus for secondary battery cells and a leak inspection method for secondary battery cells to determine whether leakage occurs…",
  "path": "/patents/1376357",
  "publishedAt": "2025-07-24T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01M3/26",
    "HANA TECHNOLOGY CO., LTD."
  ],
  "textContent": "Proposed are a leak inspection apparatus for secondary battery cells and a leak inspection method for secondary battery cells and, more particularly, a leak inspection apparatus for secondary battery cells and a leak inspection method for secondary battery cells to determine whether leakage occurs in a secondary battery cell being inspected by creating a pressure difference between the inside of a casing of the secondary battery cell accommodated in a chamber part and the internal space of the chamber part and detecting swelling of the secondary battery cell.",
  "title": "LEAK INSPECTION APPARATUS AND METHOD FOR SECONDARY BATTERY CELL"
}