{
  "$type": "site.standard.document",
  "description": "Provided is a probe unit for a charge/discharge inspection device that includes: a first probe holding plate on which one or more positive-electrode probes are arranged in order; and a second probe holding plate that is opposite to the first probe holding plate and on which one or more…",
  "path": "/patents/1376540",
  "publishedAt": "2025-08-14T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/3644",
    "NIPPON STEEL TEXENG. CO., LTD."
  ],
  "textContent": "Provided is a probe unit for a charge/discharge inspection device that includes: a first probe holding plate on which one or more positive-electrode probes are arranged in order; and a second probe holding plate that is opposite to the first probe holding plate and on which one or more negative-electrode probes are arranged in order so as to correspond to the one or more positive-electrode probes, wherein the first probe holding plate or/and the second probe holding plate are attached so as to be movable in a direction toward each other and a direction away from each other. In particular, the probe unit includes a first moving mechanism that moves the first probe holding plate or/and the second probe holding plate in the direction toward each other and the direction away from each other.",
  "title": "PROBE UNIT AND CHARGE/DISCHARGE INSPECTION DEVICE"
}