{
  "$type": "site.standard.document",
  "description": "Techniques are disclosed for a fault monitor to determine that no fault has been lost. The fault monitor may distinguish between critical and non-critical faults without the risk of missing a critical fault. The fault monitor may detect a new fault event from a fault source and may set a fault…",
  "path": "/patents/1376664",
  "publishedAt": "2025-08-28T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G06F11/0793",
    "Cypress Semiconductor Corporation"
  ],
  "textContent": "Techniques are disclosed for a fault monitor to determine that no fault has been lost. The fault monitor may distinguish between critical and non-critical faults without the risk of missing a critical fault. The fault monitor may detect a new fault event from a fault source and may set a fault overrun flag when the new fault event is detected while an existing fault event from the fault source is being processed. When the fault monitor receives a fault acknowledgement to indicate completion of processing of the existing fault event, the fault monitor may generate a request to process the new fault event as an overrun fault based on the fault overrun flag is set. The fault monitor may generate a request to process the new fault event as a non-overrun fault when the new fault event is detected without an existing fault event from the fault source being processed.",
  "title": "FAULT OVERRUN DETECTION FEATURE"
}