{
  "$type": "site.standard.document",
  "description": "The present disclosure provides a method for detecting a defective cell. The method may include: charging a cell in a manner that the state of charge (SOC) of the cell falls within a reference range, obtaining first charge data including differential voltage information of a negative electrode of…",
  "path": "/patents/1377784",
  "publishedAt": "2026-01-01T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/388",
    "SAMSUNG SDI CO., LTD."
  ],
  "textContent": "The present disclosure provides a method for detecting a defective cell. The method may include: charging a cell in a manner that the state of charge (SOC) of the cell falls within a reference range, obtaining first charge data including differential voltage information of a negative electrode of the cell while the cell is being charged, where the negative electrode includes graphite and silicon, calculating a charging parameter associated with the silicon of the negative electrode based on the first charge data, and determining whether the cell is defective based on the charging parameter associated with the silicon.",
  "title": "METHOD AND SYSTEM FOR DETECTING DEFECTIVE CELLS"
}