{
  "$type": "site.standard.document",
  "description": "Systems, methods, and other embodiments described herein relate to monitoring the manufacturing processes of thin film substrates to detect anomalies in the manufacturing process. In one embodiment, a method includes identifying, from an output of the sensor, a tension-induced feature on a surface…",
  "path": "/patents/1380117",
  "publishedAt": "2026-03-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G05B19/41875",
    "Toyota Research Institute, Inc."
  ],
  "textContent": "Systems, methods, and other embodiments described herein relate to monitoring the manufacturing processes of thin film substrates to detect anomalies in the manufacturing process. In one embodiment, a method includes identifying, from an output of the sensor, a tension-induced feature on a surface of the thin film substrate that is under tension in a manufacturing system. The method also includes detecting that the manufacturing system is in a fault state based on a characteristic of the tension-induced feature and executing a remedial action responsive to the manufacturing system being in the fault state.",
  "title": "SYSTEMS AND METHODS FOR MONITORING THIN FILM SUBSTRATE MANUFACTURING PROCESSES"
}