{
  "$type": "site.standard.document",
  "description": "An inspection device comprises a layer conveyor which has a pickup and a drive in order to pick up a respective individual anode or cathode layer from a transfer location and bring it to a delivery location. A stacking table picks up the anode or cathode layer from the pickup at the delivery…",
  "path": "/patents/1380830",
  "publishedAt": "2026-04-09T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H01M10/0404",
    "MB Automation GmbH & Co. KG"
  ],
  "textContent": "An inspection device comprises a layer conveyor which has a pickup and a drive in order to pick up a respective individual anode or cathode layer from a transfer location and bring it to a delivery location. A stacking table picks up the anode or cathode layer from the pickup at the delivery location to form a layer stack. The layer conveyor delivers an anode or cathode layer from its pickup to the stacking table at the delivery location. An image sensor is directed towards an area encompassing an upper edge of the layer stack located on the stacking table, which comprises a connection tab of the anode or cathode layer located at the top of the layer stack and performs an image feed before or after the anode or cathode layer is deposited on the stacking table.",
  "title": "INSPECTION DURING THE MANUFACTURE OF MODULES OR PRECURSORS OF MODULES"
}