{
  "$type": "site.standard.document",
  "description": "It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform…",
  "path": "/patents/1010514",
  "publishedAt": "2011-08-03T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C17/38",
    "ASAHI KASEI MICRODEVICES CORP [JP]"
  ],
  "textContent": "It is possible to rapidly or highly accurately estimate a highly reliable offset according to situations and improve further the reliability of the estimated offset even if a measurement data is not obtained in a space in which the magnitude of a vector physical quantity to be measured is uniform. The offset included in the obtained vector physical quantity data are statistically estimated based on a predetermined evaluation formula using a difference vectors. In the estimation of the offset, reliability information on a reference point is calculated based on at least one of the vector physical quantity data, the difference vectors and a plurality of estimated reference points according to a calculation parameter for calculating the reliability information on the reference point, whether or not the reference point is reliable is determined by comparing the reliability information with a determination threshold value, and the reference point determined to be reliable is output as an offset included in vector physical quantity data determined by a data acquisition portion.",
  "title": "PHYSICAL QUANTITY MEASUREMENT DEVICE AND PHYSICAL QUANTITY MEASUREMENT METHOD"
}