{
  "$type": "site.standard.document",
  "description": "A layer short-circuit of a switch element such as a FET included in an electromagnetic load circuit is detected to accurately perform a failure diagnosis of the electromagnetic load circuit. A failure diagnosis circuit 101 is provided which detects a layer short-circuit in which a high-side switch…",
  "path": "/patents/1012934",
  "publishedAt": "2011-05-18T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "F02D41/20",
    "HITACHI AUTOMOTIVE SYSTEMS LTD [JP]"
  ],
  "textContent": "A layer short-circuit of a switch element such as a FET included in an electromagnetic load circuit is detected to accurately perform a failure diagnosis of the electromagnetic load circuit. A failure diagnosis circuit 101 is provided which detects a layer short-circuit in which a high-side switch element, a low-side switch element, or an electromagnetic load itself short-circuits with a power supply voltage terminal or a ground in a state of having a predetermined impedance to perform a failure diagnosis.",
  "title": "ELECTROMAGNETIC LOAD CIRCUIT FAILURE DIAGNOSIS DEVICE"
}