{
  "$type": "site.standard.document",
  "description": "A position measurement method includes an exterior orientation parameter correcting step S11 for correcting exterior orientation parameters calculated in a step S10, based on difference between photographing timing of an image and obtaining timing of a photographing position and/or a photographing…",
  "path": "/patents/1013999",
  "publishedAt": "2011-04-13T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C11/06",
    "TOPCON CORP [JP]"
  ],
  "textContent": "A position measurement method includes an exterior orientation parameter correcting step S11 for correcting exterior orientation parameters calculated in a step S10, based on difference between photographing timing of an image and obtaining timing of a photographing position and/or a photographing posture measured outside, a bundle-adjusting step S12 for simultaneously adjusting a bundle of the exterior orientation parameters of one or more images and three-dimensional coordinates of characteristic points, based on the exterior orientation parameters corrected by the step S11, a three-dimensional coordinate calculating step S13 for calculating three-dimensional coordinates of characteristic points subsequently detected in an area in which the density of the characteristic points is decreased, based on the exterior orientation parameters adjusted bundle thereof, and a repeating step for repeating processing from the steps S10 to S13 until the image becomes a final image.",
  "title": "POSITION MEASUREMENT METHOD, POSITION MEASUREMENT DEVICE, AND PROGRAM"
}