{
  "$type": "site.standard.document",
  "description": "A semiconductor integrated circuit includes a first detection circuit and a second detection circuit. The first detection circuit is configured to assert a first signal until a first input voltage decreases from a first detection voltage to a first operating voltage limit, and to cause the first…",
  "path": "/patents/1375516",
  "publishedAt": "2025-05-15T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H03K17/223",
    "MITSUMI ELECTRIC CO., LTD."
  ],
  "textContent": "A semiconductor integrated circuit includes a first detection circuit and a second detection circuit. The first detection circuit is configured to assert a first signal until a first input voltage decreases from a first detection voltage to a first operating voltage limit, and to cause the first signal to enter an indeterminate state, upon occurrence of a condition in which the first input voltage decreases to be less than the first operating voltage limit. The second detection circuit is configured to assert a second signal until a second input voltage decreases from a second detection voltage to a second operating voltage limit, and to cause the second signal to enter an indeterminate state, upon occurrence of a condition in which the second input voltage decreases to be less than the second operating voltage limit.",
  "title": "SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC DEVICE"
}