{
  "$type": "site.standard.document",
  "description": "A semiconductor apparatus including: multiple parallel monitor circuits each configured to control charge to a capacitor by controlling a transistor that bypasses, if the voltage of the capacitor exceeds a predetermined reference voltage, charge current provided to the capacitor. The semiconductor…",
  "path": "/patents/1073659",
  "publishedAt": "2005-09-28T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H02J7/54",
    "RICOH KK [JP]"
  ],
  "textContent": "A semiconductor apparatus including: multiple parallel monitor circuits each configured to control charge to a capacitor by controlling a transistor that bypasses, if the voltage of the capacitor exceeds a predetermined reference voltage, charge current provided to the capacitor. The semiconductor apparatus further includes high voltage side IC connection output terminals each connected to an open drain of N channel transistor; high voltage side IC connection input terminals each connected to a terminal of a high resistance component and to an inverter input terminal; low voltage side IC connection output terminal each connected to an open drain of P channel transistor; and low voltage side IC connection input terminal each connected to a terminal of a high resistance component and to an inverter input terminal.",
  "title": "Cascadable semiconductor device for capacitor charge monitoring"
}