{
  "$type": "site.standard.document",
  "description": "A particular method includes, prior to issuing a recommendation by an adaptive voltage scaling (AVS) system, performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation. The method further includes performing at…",
  "path": "/patents/1126753",
  "publishedAt": "2014-06-05T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H02J4/00",
    "QUALCOMM Incorporated"
  ],
  "textContent": "A particular method includes, prior to issuing a recommendation by an adaptive voltage scaling (AVS) system, performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation. The method further includes performing at least one additional iteration of the AVS operation to determine at least one additional adjustment iteration. When a threshold number of consecutive adjustment recommendations are consistent, the method includes issuing the recommendation by the AVS system.",
  "title": "SYSTEM AND METHOD OF ADAPTIVE VOLTAGE SCALING"
}