{
  "$type": "site.standard.document",
  "description": "An angular rotation measuring apparatus and method is described. The apparatus comprises at least one dither frame formed of an upper sensor layer, the frame having a dither axis disposed parallel to the upper sensor layer and to a parallel lower handle layer. The apparatus further comprises a…",
  "path": "/patents/1092100",
  "publishedAt": "2003-11-05T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C19/5719",
    "L 3 COMM CORP [US]"
  ],
  "textContent": "An angular rotation measuring apparatus and method is described. The apparatus comprises at least one dither frame formed of an upper sensor layer, the frame having a dither axis disposed parallel to the upper sensor layer and to a parallel lower handle layer. The apparatus further comprises a first and a second accelerometer formed of the upper sensor layer and having a first and second force sensing axis perpendicular to the dither axis, each of the first and second accelerometers having a proof mass and at least one flexure connecting the proof mass to the dither frame such that the proof mass can be electrically rotated perpendicular to the dither axis. The dither frame and proof masses have electrodes for operating the first and second accelerometers and the upper sensor layer has a rate axis perperdicular to the first and second force sensing axes and the dither axis.",
  "title": "Angular rate sensor"
}