{
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  "coverImage": {
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  "description": "Differential charge amplifier for processing charge signals from a rotation rate sensor, with a test signal being applied to the differential charge amplifier so that during normal operation the output of the amplifier corresponds to the test signal as well as to the charge signals.",
  "path": "/patents/1094058",
  "publishedAt": "2003-08-13T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C19/5607",
    "BEI TECHNOLOGIES INC [US]"
  ],
  "textContent": "Differential charge amplifier for processing charge signals from a rotation rate sensor, with a test signal being applied to the differential charge amplifier so that during normal operation the output of the amplifier corresponds to the test signal as well as to the charge signals.",
  "title": "Differential charge amplifier with built-in testing for rotation rate sensor"
}