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  "path": "/news/2026-05-longstanding-problem-semiconductor-defects.html",
  "publishedAt": "2026-05-14T16:14:39.000Z",
  "site": "https://techxplore.com",
  "tags": [
    "Electronics & Semiconductors"
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  "textContent": "Researchers at Sandia National Laboratories and Auburn University have developed a new method to more accurately detect atomic-scale defects in electronic materials, an advance that could help improve technologies ranging from electric vehicles to high-power electronics. The study, appearing in the Journal of Applied Physics, addresses a longstanding challenge in understanding what happens at the critical boundary where a semiconductor meets an insulating layer.",
  "title": "Researchers solve longstanding problem in measuring semiconductor defects"
}