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  "path": "/news/2026-05-ai-scans-aim-ceramic-defects.html",
  "publishedAt": "2026-05-12T16:40:04.000Z",
  "site": "https://techxplore.com",
  "tags": [
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  "textContent": "At Sandia National Laboratories, a new inspection workflow is taking shape that could help catch tiny defects earlier in the manufacturing process for ceramic components.",
  "title": "AI-assisted scans aim to catch ceramic defects earlier in production"
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