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  "path": "/nanotechnology-news3/newsid=69111.php",
  "publishedAt": "2026-04-08T22:00:48.000Z",
  "site": "https://www.nanowerk.com",
  "textContent": "A review paper presents an integrated AFM framework for observing, manipulating, and engineering ferroelectric materials at the nanoscale for semiconductor applications.",
  "title": "Atomic force microscopy becomes a design tool for ferroelectric materials"
}